2007'03.20.Tue
Nextest Exhibits Cost-Effective Test Solutions at SEMICON/China 2007

March 19, 2007
SHANGHAI, China, March 19 /Xinhua-PRNewswire/ --
Nextest Systems Corporation (Nasdaq: NEXT), a leading
manufacturer of automatic test equipment (ATE) for
cost-sensitive semiconductors, announced today it will
exhibit at SEMICON/China in Shanghai, March 21-23, 2007.
The conference is a premiere venue for companies in the
semiconductor equipment industry to help foster new
business opportunities in China and the Asia-Pacific
region.
Nextest will showcase products that address the test
challenges associated with high-volume flash, logic, SOC,
and image sensor device types. These solutions are designed
to increase volume, throughput, and reliability while
reducing the cost of test.
Nextest will feature the following test solutions in
booth #2000 at SEMICON/China:
Magnum iCP-EV
On display for the first time, and the first of its
kind, is the 128-pin Magnum iCP-EV "personal"
test system. Focused at the CMOS Image Sensor (CIS) market,
Magnum iCP-EV offers CIS manufacturers a low-cost
engineering alternative for program development and debug.
Due to the tester's small physical size, engineering can
perform the necessary work in an office environment, prior
to moving devices to the Magnum iCP for volume-production
testing. This innovative approach allows for a smooth
transition to test CIS devices in parallel and is a much
more cost-effective method over utilizing expensive,
"large-iron" test equipment for required
engineering.
CIS devices are being utilized in numerous consumer
products such as cell phones, still cameras, web cams,
PDA's, and security cameras, with a plethora of new
applications emerging in the near future.
Magnum SV
Also on display at SEMICON/China is the 1280-pin Magnum
SV test system. Targeted at the high-growth flash, logic,
and SOC markets, Magnum SV is a highly efficient,
production-test solution that increases throughput and
reduces test times significantly. Magnum SV, when combined
with the appropriate prober or handler, creates an
interface solution capable of testing up to 160 devices in
parallel for the cost-sensitive consumer digital device
market. With Magnum's flexible architecture, systems can be
configured with a minimum of 128 pins on the Magnum PV, and
as many as 7,680 pins, and 960 sites, with the Magnum
Grande. Moreover, all Magnums utilize the same operating
software, test programs, internal components and spare
parts -- thus eliminating additional costs associated with
training and inventory of spares.
ABOUT NEXTEST
Nextest Systems Corporation is a low-cost leader in the
design and manufacture of automatic test equipment (ATE) for
Flash memory and System-On-Chip semiconductors. Nextest's
products address the growing demand from manufacturers for
ATE with increased throughput, functionality and
reliability, while reducing time to market and cost of
test. Nextest has shipped over 1,700 systems to more than
60 semiconductor companies worldwide. Further information
is available at http://www.nextest.com .
For more information, please contact:
Nextest Agency Contact:
Connie Graybeal-Berar
GEM Design & Public Relations
Tel: +1-408-529-4694
Email: cberar@mac.com
PR
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